diff --git a/prod/doc/Makefile b/prod/doc/Makefile
index 1820f86..e197d05 100644
--- a/prod/doc/Makefile
+++ b/prod/doc/Makefile
@@ -9,8 +9,11 @@ DL=http://downloads.qi-hardware.com/people/werner/wpan/tmp
.PHONY: all upload clean
-all: $(PNGS) $(JPGS)
+all: $(HTMLS) $(PNGS) $(JPGS)
+index.html: index.hmac style.inc hmac.pl
+ perl hmac.pl index.hmac >$@ || { rm -f $@; exit 1; }
+
flow.png: flow.fig
fig2dev -L png -m 0.7 -S 4 $< $@ || { rm -f $@; exit 1; }
diff --git a/prod/doc/index.html b/prod/doc/index.hmac
similarity index 79%
rename from prod/doc/index.html
rename to prod/doc/index.hmac
index 5bdada2..3befeca 100644
--- a/prod/doc/index.html
+++ b/prod/doc/index.hmac
@@ -1,7 +1,22 @@
-Production and testing
-
+
-Production and testing
+Production and testing
+
+
+
+
+
+ Software setup
+ Flashing
+ Functional test
+ Fault analysis
+
+
+
+ Terminology
+ Detailed description
+
+
This document gives a high-level description of the production test process
for atben and atusb boards, plus - in the case of atusb
@@ -32,7 +47,7 @@ Defective devices can be discarded or retained for a deeper analysis.
-
Terminology
+
- Ben
@@ -62,7 +77,7 @@ Defective devices can be discarded or retained for a deeper analysis.
as needed.
- DUT
- Device Under Test. An atben or atusb board that
- has left SMT, and is being prepared for testing or in the process
+ has left SMT, and is being prepared for testing or is in the process
of being tested.
- Reference device
- An atben or atusb device that is known to work and
@@ -79,7 +94,7 @@ Defective devices can be discarded or retained for a deeper analysis.
-
Detailed description
+
The following pages describe the preparation and the execution of the
production and test process:
@@ -93,7 +108,7 @@ production and test process:
-Last update: 2011-05-19 Werner Almesberger
+Last update: 2011-05-27 Werner Almesberger