qi-hardware/ben-wpan
1
0
Fork 0
mirror of git://projects.qi-hardware.com/ben-wpan.git synced 2024-11-29 10:01:53 +02:00
Code

prod/doc/: converted index.html to index.hmac

Browse Source
This commit is contained in:
Werner Almesberger 2011-05-27 06:31:11 -03:00
parent a99fbbfb27
commit 2f6c22dbba
2 changed files with 26 additions and 8 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

5
prod/doc/Makefile
View File

@ -9,8 +9,11 @@ DL=http://downloads.qi-hardware.com/people/werner/wpan/tmp
.PHONY: all upload clean .PHONY: all upload clean
all: $(PNGS) $(JPGS) all: $(HTMLS) $(PNGS) $(JPGS)
index.html: index.hmac style.inc hmac.pl
perl hmac.pl index.hmac >$@ || { rm -f $@; exit 1; }
flow.png: flow.fig flow.png: flow.fig
fig2dev -L png -m 0.7 -S 4 $< $@ || { rm -f $@; exit 1; } fig2dev -L png -m 0.7 -S 4 $< $@ || { rm -f $@; exit 1; }

29
prod/doc/index.html → prod/doc/index.hmac
View File

@ -1,7 +1,22 @@
<TITLE>Production and testing</TITLE> <!DOCTYPE HTML PUBLIC "-//W3C//DTD HTML 4.01 Transitional//EN">
<BODY>
<HTML> <HTML>
<H1>Production and testing</H1> <TITLE>Production and testing</TITLE>
<BODY bgcolor="#ffffff" link="#000000" vlink="#404040">
<INCLUDE file="style.inc">
<PAGE_BAR title="Production and testing">
<PAGE_ITEM href="setup.html">Software setup</PAGE_ITEM>
<PAGE_ITEM href="flash.html">Flashing</PAGE_ITEM>
<PAGE_ITEM href="test.html">Functional test</PAGE_ITEM>
<PAGE_ITEM href="analysis.html">Fault analysis</PAGE_ITEM>
</PAGE_BAR>
<SECTION_BAR>
<SECTION_ITEM href="#terminology">Terminology</SECTION_ITEM>
<SECTION_ITEM href="#details">Detailed description</SECTION_ITEM>
</SECTION_BAR>
<P>
This document gives a high-level description of the production test process This document gives a high-level description of the production test process
for <B>atben</B> and <B>atusb</B> boards, plus - in the case of <B>atusb</B> for <B>atben</B> and <B>atusb</B> boards, plus - in the case of <B>atusb</B>
@ -32,7 +47,7 @@ Defective devices can be discarded or retained for a deeper analysis.
<!-- ====================================================================== --> <!-- ====================================================================== -->
<H2>Terminology</H2> <SECTION ref="terminology" title="Terminology">
<DL> <DL>
<DT>Ben</DT> <DT>Ben</DT>
@ -62,7 +77,7 @@ Defective devices can be discarded or retained for a deeper analysis.
as needed. as needed.
<DT>DUT</DT> <DT>DUT</DT>
<DD>Device Under Test. An <B>atben</B> or <B>atusb</B> board that <DD>Device Under Test. An <B>atben</B> or <B>atusb</B> board that
has left SMT, and is being prepared for testing or in the process has left SMT, and is being prepared for testing or is in the process
of being tested. of being tested.
<DT>Reference device</DT> <DT>Reference device</DT>
<DD>An <B>atben</B> or <B>atusb</B> device that is known to work and <DD>An <B>atben</B> or <B>atusb</B> device that is known to work and
@ -79,7 +94,7 @@ Defective devices can be discarded or retained for a deeper analysis.
<!-- ====================================================================== --> <!-- ====================================================================== -->
<H2>Detailed description</H2> <SECTION ref="details" title="Detailed description">
The following pages describe the preparation and the execution of the The following pages describe the preparation and the execution of the
production and test process: production and test process:
@ -93,7 +108,7 @@ production and test process:
<P> <P>
<HR> <HR>
Last update: 2011-05-19&nbsp;&nbsp;<I>Werner Almesberger</I> Last update: 2011-05-27&nbsp;&nbsp;<I>Werner Almesberger</I>
<HR> <HR>
</BODY> </BODY>
</HTML> </HTML>