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prod/: use positive and negative offset in spectrum test
This way, we can also spot issues in the digital interface leading to mis-configurations. E.g., this one would be a defective SLP_TR line in atusb: http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png - prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets - prod/Makefile (spectrum): print a direction indication before running atrf-path
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@ -178,8 +178,7 @@ spectrum()
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# todo:
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# - trim values (maybe)
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# - decide on power
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# - decide on offset
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cmd "atrf-path -g -T +0.5 -P $PROFILE $REF $DUT 10"
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cmd "atrf-path -g -P $PROFILE $REF $DUT 10"
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expect PASS
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}
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@ -34,10 +34,12 @@ flash:
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./atusb-flash $(ATUSB_REF) $(ATUSB_DUT)
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spectrum:
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atrf-path -g -T +0.5 $(ATBEN_REF) $(ATBEN_DUT) 10 | \
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@echo "$(ATBEN_REF) => $(ATBEN_DUT)"
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atrf-path -g $(ATBEN_REF) $(ATBEN_DUT) 10 | \
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$(GENPATHPROF) $(SPECTRUM_MARGIN) >ben.profile || \
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{ rm -rf ben.profile; exit 1; }
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atrf-path -g -T +0.5 $(ATUSB_REF) $(ATUSB_DUT) 10 | \
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@echo "$(ATBEN_DUT) => $(ATBEN_BEN)"
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atrf-path -g $(ATUSB_REF) $(ATUSB_DUT) 10 | \
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$(GENPATHPROF) $(SPECTRUM_MARGIN) >usb.profile || \
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{ rm -rf usb.profile; exit 1; }
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