diff --git a/prod/doc/index.html b/prod/doc/index.html index 28b67ec..5bdada2 100644 --- a/prod/doc/index.html +++ b/prod/doc/index.html @@ -64,7 +64,7 @@ Defective devices can be discarded or retained for a deeper analysis.
Device Under Test. An atben or atusb board that has left SMT, and is being prepared for testing or in the process of being tested. -
Reference
+
Reference device
An atben or atusb device that is known to work and and that acts as a peer for RF communication with the DUT.
SMT
@@ -93,7 +93,7 @@ production and test process:


-Last update: 2011-05-18  Werner Almesberger +Last update: 2011-05-19  Werner Almesberger
diff --git a/prod/doc/setup.html b/prod/doc/setup.html index 8f8280d..b51aae9 100644 --- a/prod/doc/setup.html +++ b/prod/doc/setup.html @@ -56,8 +56,8 @@ echo 192.168.1.202 jlime >>/etc/hosts

Ben system setup

The configuration setting described in this section are lost on each -reset or reboot and either need to be entered again or a setup script -running at boot time has to be written. +reset or reboot and either need to be entered again. Alternatively, +a setup script running at boot time can be written. @@ -150,8 +150,10 @@ clock count with an accuracy of about +/−20 ppm: atrf-xtal 1000 >ben.xtal

-Note that this value depends on the tolerance of the crystal in the Ben -and is also affected by temperature. The above accuracy can therefore +This takes about 5 seconds. +

+Note that the result depends on the tolerance of the crystal in the Ben +and is also affected by temperature. Good accuracy can therefore only be obtained if this measurement is performed individually on each Ben, and if a stable temperature is maintained. @@ -167,7 +169,7 @@ Ben, and if a stable temperature is maintained. Up: Production and testing  Next: Flashing (atusb only) 


-Last update: 2011-05-18  Werner Almesberger +Last update: 2011-05-19  Werner Almesberger