@@ -30,6 +31,159 @@
+make ben ++for an atben DUT and with +
+make usb ++for an atusb DUT. It performs the following steps: +
+The test scripts log the commands they execute and their output in the +file _log. + + + + + +
+On atben, failure may simply indicate an improperly +inserted board. Eject the board, re-insert, and try again. If the test +keeps on failing, this may indicate a problem with MOSI, MISO, nSEL, +SCLK, the power supply, the crystal oscillator, or possibly the position +of the transceiver chip. +
+Note: this test is meant as a higher level test. The GPIO test should +eventually provide more detailed results for problems with the SPI interface. + + + + + +
+If this test fails, this may indicate that the load capacitors of the +crystal are missing, badly soldered, or have the wrong value. It could +also mean that the crystal itself is defective. Another possible cause +of oscillator malfunction could be flux residues bridging traces. +
+The fault analysis page has more details on +testing the crystal oscillator. + + + + + +
+This test depends on numerous external factors, like the exact position +and orientation of the two devices with respect to each other, and the +presence of any items that can reflect or absorb RF signals. Such items +include metal chairs and human bodies. Because of the test's sensitivity +to environmental factors, the operator needs to decide when the result +represents a valid measurement and then confirm the result shown. +
+The image below shows the typical display during the spectrum test: +the white line is the measured signal strength. The red lines indicate +the minimum and maximum allowed values. The green circle in the upper +right corner indicates that the signal strength is within the limits. +A downward-pointing red triangle would indicate that the signal is too +weak, an upward-pointing yellow triangle would indicate that the signal +is too strong. +
+
+To finish the test, the operator must type either P, F,
+or Q in the window shown. P means "pass" and can only be
+entered if the measurement is within the limits. F means "fail"
+and can only be entered if the measurements is outside the limits.
+Q, quit, can be entered at any time and also fails the test.
+
+
+
+
+
+
+Another possible cause could a problem with the SLP_TR signal. The
+GPIO test should eventually catch this issue, but it may currently
+remain undetected until the send test.
+Receive
+
+In the receive test, the reference device sends a number of frames to the
+DUT. The test program verifies correct reception of all the frames. A
+device that has passed all the preceding tests should not encounter
+problems in the receive test. If it does, there may be a problem with
+the bypassing of the transceiver's 1.8 V supplies.
+
+
+
+
+
+Send
+
+The send test is like the receive test, but with the DUT acting as the
+sender and the reference acting as the receiver. If a device passes the
+receive test but fails the send test, there is probably an issue with
+the bypass capacitors of the analog 1.8 V supply.
+
@@ -37,7 +191,7 @@ Up: Production and testing
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