The two devices should be about 1 m apart. Their vicinity should be free from obstructions and items that can reflect or absorb RF signals. Such items include metal chairs and human bodies. Location and orientation should be easily reproducible, e.g., by marking the device's edges on the table with tape. Other transmitters in the 2.4 GHz band will interfere with measurements and should be kept as far away and as inactive as possible.
The test scripts log the commands they execute and their output in the
file _log.
If the GPIO scan encounters an inconsistency, it fails the test and writes
a report to the
file _log. This report contains a list of GPIO pins with their
configuration, the expected value, and their actual value.
For example, a short between SLP_TR and VDD on an atben board would
be reported as follows:
On atben, failure may simply indicate an improperly
inserted board. Eject the board, re-insert, and try again. If the test
keeps on failing, this may indicate a problem with MOSI, MISO, nSEL,
SCLK, the power supply, the crystal oscillator, or possibly the position
of the transceiver chip.
Note: this test is meant as a higher level test. The GPIO test should
eventually provide more detailed results for problems with the SPI interface.
If this test fails, this may indicate that the load capacitors of the
crystal are missing, badly soldered, or have the wrong value. It could
also mean that the crystal itself is defective. Another possible cause
of oscillator malfunction could be flux residues bridging traces.
The fault analysis page has more details on
testing the crystal oscillator.
This test depends on numerous external factors, like the exact position
and orientation of the two devices with respect to each other, and the
presence of obstacles and conductive items (metal, people, etc.).
Because of the test's sensitivity
to environmental factors, the operator needs to decide when the result
represents a valid measurement and then confirm the result shown.
The image below shows the typical display during the spectrum test:
the white line is the measured signal strength. The red lines indicate
the minimum and maximum allowed values. The green circle in the upper
right corner indicates that the signal strength is within the limits.
A downward-pointing red triangle would indicate that the signal is too
weak, an upward-pointing yellow triangle would indicate that the signal
is too strong.
To finish the test, the operator must type either P, F,
or Q. P means "pass" and can only be
entered if the measurement is within the limits. F means "fail"
and can only be entered if the measurements is outside the limits.
Q, quit, can be entered at any time and also fails the test.
Another possible cause could a problem with the SLP_TR signal. The
GPIO test should eventually catch this issue, but it may currently
remain undetected until the send test.
make ben
for an atben DUT and with
make usb
for an atusb DUT. It performs the following steps:
Of these tests, only "LED" and "Spectrum" require operator input. The
other tests run without interaction.
name cfg exp got
SCLK Z - 1
MISO Z - 1
SLP_TR Z 0 1 ***
MOSI Z - 1
nSEL Z 1 1
IRQ Z 0 0
at "zzozho", next "# reset state"
The configuration is 0 for a pin driven low, 1 for a pin driven
high, Z for a pin in Hi-Z state, and R for Hi-Z state with a
pull-up.