mirror of
git://projects.qi-hardware.com/ben-wpan.git
synced 2024-11-26 17:59:41 +02:00
198 lines
6.2 KiB
HTML
198 lines
6.2 KiB
HTML
<TITLE>Production and testing: Functional test</TITLE>
|
|
<BODY>
|
|
<HTML>
|
|
<H1>Production and testing: Functional test</H1>
|
|
|
|
|
|
<!-- ====================================================================== -->
|
|
|
|
|
|
<H2>Test setup for atben</H2>
|
|
|
|
To test an <B>atben</B> board, place a reference <B>atusb</B> board into
|
|
the PC, insert the
|
|
<P>
|
|
<IMG src="setup-A.png">
|
|
<P>
|
|
|
|
|
|
<!-- ====================================================================== -->
|
|
|
|
|
|
<H2>Test setup for atusb</H2>
|
|
|
|
<P>
|
|
<IMG src="setup-B.png">
|
|
<P>
|
|
|
|
|
|
<!-- ====================================================================== -->
|
|
|
|
|
|
<H2>Test procedure</H2>
|
|
|
|
The test process is started with
|
|
<PRE>
|
|
make ben
|
|
</PRE>
|
|
for an <B>atben</B> DUT and with
|
|
<PRE>
|
|
make usb
|
|
</PRE>
|
|
for an <B>atusb</B> DUT. It performs the following steps:
|
|
<UL>
|
|
<LI>Enumeration (<B>atusb</B> only)
|
|
<LI>LED (<B>atusb</B> only; not yet implemented)
|
|
<LI>GPIO scan (not yet implemented)
|
|
<LI>Identification
|
|
<LI>Crystal frequency (only implemented on <B>atben</B>)
|
|
<LI>Spectrum
|
|
<LI>Receive
|
|
<LI>Send
|
|
</UL>
|
|
|
|
Of these tests, only "LED" and "Spectrum" require operator input. The
|
|
other tests run without interaction.
|
|
<P>
|
|
The test scripts log the commands they execute and their output in the
|
|
file <B>_log</B>.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Enumeration (atusb only)</H3>
|
|
|
|
The enumeration test verifies that the <B>atusb</B> board has been
|
|
identified by the PC's USB stack. If this test fails, the board may
|
|
not be plugged in correctly or it may be missing the firmware. A
|
|
board that has passed both stages of the firmware flashing process
|
|
should always pass the enumeration test.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>LED (atusb only)</H3>
|
|
|
|
@@@
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>GPIO scan</H3>
|
|
|
|
@@@
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Identification</H3>
|
|
|
|
This test reads the transceiver's registers that contain values identifying
|
|
the manufacturer, the chip's part number, and the chip revision. If an
|
|
<B>atusb</B> board fails this test, this probably means that the MISO signal
|
|
between transceiver and the microcontroller has a problem.
|
|
<P>
|
|
On <B>atben</B>, failure may simply indicate an improperly
|
|
inserted board. Eject the board, re-insert, and try again. If the test
|
|
keeps on failing, this may indicate a problem with MOSI, MISO, nSEL,
|
|
SCLK, the power supply, the crystal oscillator, or possibly the position
|
|
of the transceiver chip.
|
|
<P>
|
|
Note: this test is meant as a higher level test. The GPIO test should
|
|
eventually provide more detailed results for problems with the SPI interface.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Crystal frequency (atben only)</H3>
|
|
|
|
This test measures the frequency of the crystal oscillator in the DUT.
|
|
On <B>atben</B>, it does this by transmitting packets, and measuring
|
|
the time between the SLP_TR pulse that starts the transmission and the
|
|
interrupt signaling the end of the transmission.
|
|
<P>
|
|
If this test fails, this may indicate that the load capacitors of the
|
|
crystal are missing, badly soldered, or have the wrong value. It could
|
|
also mean that the crystal itself is defective. Another possible cause
|
|
of oscillator malfunction could be flux residues bridging traces.
|
|
<P>
|
|
The <A href="fault.html">fault analysis page</A> has more details on
|
|
testing the crystal oscillator.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Spectrum</H3>
|
|
|
|
The spectrum test measures the reception of a signal sent from the
|
|
reference device to the DUT. It does this across the entire frequency
|
|
range in which the WPAN boards operate, allowing the detection of
|
|
frequency-dependent anomalies.
|
|
<P>
|
|
This test depends on numerous external factors, like the exact position
|
|
and orientation of the two devices with respect to each other, and the
|
|
presence of any items that can reflect or absorb RF signals. Such items
|
|
include metal chairs and human bodies. Because of the test's sensitivity
|
|
to environmental factors, the operator needs to decide when the result
|
|
represents a valid measurement and then confirm the result shown.
|
|
<P>
|
|
The image below shows the typical display during the spectrum test:
|
|
the white line is the measured signal strength. The red lines indicate
|
|
the minimum and maximum allowed values. The green circle in the upper
|
|
right corner indicates that the signal strength is within the limits.
|
|
A downward-pointing red triangle would indicate that the signal is too
|
|
weak, an upward-pointing yellow triangle would indicate that the signal
|
|
is too strong.
|
|
<P>
|
|
<A href="atrf-path.png"><IMG src="atrf-path-small.png"</A>
|
|
<P>
|
|
To finish the test, the operator must type either <B>P</B>, <B>F</B>,
|
|
or <B>Q</B> in the window shown. <B>P</B> means "pass" and can only be
|
|
entered if the measurement is within the limits. <B>F</B> means "fail"
|
|
and can only be entered if the measurements is outside the limits.
|
|
<B>Q</B>, quit, can be entered at any time and also fails the test.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Receive</H3>
|
|
|
|
In the receive test, the reference device sends a number of frames to the
|
|
DUT. The test program verifies correct reception of all the frames. A
|
|
device that has passed all the preceding tests should not encounter
|
|
problems in the receive test. If it does, there may be a problem with
|
|
the bypassing of the transceiver's 1.8 V supplies.
|
|
|
|
|
|
<!-- ---------------------------------------------------------------------- -->
|
|
|
|
|
|
<H3>Send</H3>
|
|
|
|
The send test is like the receive test, but with the DUT acting as the
|
|
sender and the reference acting as the receiver. If a device passes the
|
|
receive test but fails the send test, there is probably an issue with
|
|
the bypass capacitors of the analog 1.8 V supply.
|
|
<P>
|
|
Another possible cause could a problem with the SLP_TR signal. The
|
|
GPIO test should eventually catch this issue, but it may currently
|
|
remain undetected until the send test.
|
|
|
|
<P>
|
|
<HR>
|
|
Up: <A href="index.html">Production and testing</A>
|
|
Prev: <A href="flash.html">Flashing (<B>atusb</B> only)</A>
|
|
Next: <A href="analysis.html">Fault analysis</A>
|
|
<HR>
|
|
Last update: 2011-05-26 <I>Werner Almesberger</I>
|
|
<HR>
|
|
</BODY>
|
|
</HTML>
|