ben-wpan/prod/doc/atben.fig

#FIG 3.2  Produced by xfig version 3.2.5b
Landscape
Center
Metric
A4      
100.00
Single
-2
1200 2
2 5 0 1 0 -1 100 -1 20 0.000 0 0 -1 0 0 5
	0 atben-front.png
	 2475 2475 8790 2475 8790 7161 2475 7161 2475 2475
# A
2 1 0 3 0 7 50 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 1980 4050 2835 4230
# A
2 1 0 3 4 7 50 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 1935 4545 3015 4365
# B
2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 2970 2025 4095 3645
# B
2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 5445 2025 4230 3645
# B
2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 1800 3735 2835 3735
# AB
2 1 0 3 0 7 55 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 9225 3825 4725 3825
# B
2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2
	5 1 3.00 60.00 120.00
	 1800 4005 2835 4005
# AB
2 4 0 2 0 7 56 -1 15 0.000 0 0 7 0 0 5
	 5040 4095 4590 4095 4590 3555 5040 3555 5040 4095
2 2 0 0 0 7 99 -1 20 0.000 0 0 -1 0 0 5
	 8820 7200 4590 7200 4590 4365 8820 4365 8820 7200
# A
4 2 0 50 -1 18 24 0.0000 4 300 915 1890 4140 GND\001
# A
4 2 4 50 -1 18 24 0.0000 4 300 1200 1890 4725 CLKM\001
# B
4 1 0 55 -1 18 24 0.0000 4 300 555 5625 1935 I/O\001
# AB
4 0 0 55 -1 18 24 0.0000 4 300 915 9315 3960 GND\001
# B
4 1 0 55 -1 18 24 0.0000 4 390 1410 2880 1935 Analog\001
# B
4 2 0 55 -1 18 24 0.0000 4 300 555 1710 4185 I/O\001
# B
4 2 0 55 -1 18 24 0.0000 4 390 1275 1710 3825 Digital\001
prod/doc/: added marked-up layout to indicate CLKM/CLK test points - atben.fig, atusb.fig: layout images overlaid by markup - Makefile: added images derived from atben.fig and atusb.fig - Makefile: added generation of the layout images atben.fig and atusb.fig are based on - analysis.html: show measurement locations for CLKM and CLK 2011-05-27 03:14:05 +03:00			`#FIG 3.2 Produced by xfig version 3.2.5b`
			`Landscape`
			`Center`
			`Metric`
			`A4`
			`100.00`
			`Single`
			`-2`
			`1200 2`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`2 5 0 1 0 -1 100 -1 20 0.000 0 0 -1 0 0 5`
prod/doc/: added marked-up layout to indicate CLKM/CLK test points - atben.fig, atusb.fig: layout images overlaid by markup - Makefile: added images derived from atben.fig and atusb.fig - Makefile: added generation of the layout images atben.fig and atusb.fig are based on - analysis.html: show measurement locations for CLKM and CLK 2011-05-27 03:14:05 +03:00			`0 atben-front.png`
			`2475 2475 8790 2475 8790 7161 2475 7161 2475 2475`
			`# A`
			`2 1 0 3 0 7 50 -1 -1 0.000 0 0 -1 1 0 2`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`5 1 3.00 60.00 120.00`
			`1980 4050 2835 4230`
prod/doc/: added marked-up layout to indicate CLKM/CLK test points - atben.fig, atusb.fig: layout images overlaid by markup - Makefile: added images derived from atben.fig and atusb.fig - Makefile: added generation of the layout images atben.fig and atusb.fig are based on - analysis.html: show measurement locations for CLKM and CLK 2011-05-27 03:14:05 +03:00			`# A`
			`2 1 0 3 4 7 50 -1 -1 0.000 0 0 -1 1 0 2`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`5 1 3.00 60.00 120.00`
			`1935 4545 3015 4365`
			`# B`
			`2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2`
			`5 1 3.00 60.00 120.00`
			`2970 2025 4095 3645`
			`# B`
			`2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2`
			`5 1 3.00 60.00 120.00`
			`5445 2025 4230 3645`
			`# B`
			`2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2`
			`5 1 3.00 60.00 120.00`
			`1800 3735 2835 3735`
prod/doc/: added scope screen shots to analysis; show crystal as alt GND for clk 2011-05-28 00:37:40 +03:00			`# AB`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`2 1 0 3 0 7 55 -1 -1 0.000 0 0 -1 1 0 2`
			`5 1 3.00 60.00 120.00`
			`9225 3825 4725 3825`
			`# B`
			`2 1 0 3 4 7 55 -1 -1 0.000 0 0 -1 1 0 2`
			`5 1 3.00 60.00 120.00`
			`1800 4005 2835 4005`
prod/doc/: added scope screen shots to analysis; show crystal as alt GND for clk 2011-05-28 00:37:40 +03:00			`# AB`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`2 4 0 2 0 7 56 -1 15 0.000 0 0 7 0 0 5`
prod/doc/: completed voltage measurement sections 2011-05-27 10:14:30 +03:00			`5040 4095 4590 4095 4590 3555 5040 3555 5040 4095`
prod/doc/atben.fig: cover unused PCB space with a white rectangle 2011-05-27 21:50:54 +03:00			`2 2 0 0 0 7 99 -1 20 0.000 0 0 -1 0 0 5`
			`8820 7200 4590 7200 4590 4365 8820 4365 8820 7200`
prod/doc/: added marked-up layout to indicate CLKM/CLK test points - atben.fig, atusb.fig: layout images overlaid by markup - Makefile: added images derived from atben.fig and atusb.fig - Makefile: added generation of the layout images atben.fig and atusb.fig are based on - analysis.html: show measurement locations for CLKM and CLK 2011-05-27 03:14:05 +03:00			`# A`
			`4 2 0 50 -1 18 24 0.0000 4 300 915 1890 4140 GND\001`
			`# A`
			`4 2 4 50 -1 18 24 0.0000 4 300 1200 1890 4725 CLKM\001`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`# B`
			`4 1 0 55 -1 18 24 0.0000 4 300 555 5625 1935 I/O\001`
prod/doc/: added scope screen shots to analysis; show crystal as alt GND for clk 2011-05-28 00:37:40 +03:00			`# AB`
prod/doc/: added voltage measurement points on layout 2011-05-27 03:57:40 +03:00			`4 0 0 55 -1 18 24 0.0000 4 300 915 9315 3960 GND\001`
			`# B`
			`4 1 0 55 -1 18 24 0.0000 4 390 1410 2880 1935 Analog\001`
			`# B`
			`4 2 0 55 -1 18 24 0.0000 4 300 555 1710 4185 I/O\001`
			`# B`
			`4 2 0 55 -1 18 24 0.0000 4 390 1275 1710 3825 Digital\001`