2011-05-27 13:02:41 +03:00
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<!DOCTYPE HTML PUBLIC "-//W3C//DTD HTML 4.01 Transitional//EN">
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<HTML>
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2011-05-27 13:02:41 +03:00
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<TITLE>Production and testing: Functional test</TITLE>
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<BODY bgcolor="#ffffff" link="#000000" vlink="#404040">
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<INCLUDE file="style.inc">
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<PAGE_BAR title="Production and testing">
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<PAGE_ITEM href="setup.html">Software setup</PAGE_ITEM>
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<PAGE_ITEM href="flash.html">Flashing</PAGE_ITEM>
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<PAGE_CURR href="test.html">Functional test</PAGE_CURR>
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<PAGE_ITEM href="analysis.html">Fault analysis</PAGE_ITEM>
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</PAGE_BAR>
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<SECTION_BAR>
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<SECTION_ITEM href="#atben">atben setup</SECTION_ITEM>
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<SECTION_ITEM href="#atusb">atusb setup</SECTION_ITEM>
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<SECTION_ITEM href="#procedure">Test procedure</SECTION_ITEM>
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</SECTION_BAR>
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-18 20:25:54 +03:00
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2011-05-27 13:02:41 +03:00
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<SECTION ref="atben" title="Test setup for atben">
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2011-05-27 01:42:57 +03:00
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To test an <B>atben</B> board, place a reference <B>atusb</B> board into
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2011-05-28 00:52:53 +03:00
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the PC, insert the <B>atben</B> board into the Ben, and place both devices
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at the same location and with the same orientation used when acquiring the
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signal strength profile.
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<P>
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2011-05-29 16:37:17 +03:00
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The two devices should be about 1 m apart. Their vicinity should be free
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from obstructions and items that can reflect or absorb RF signals. Such
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items include metal chairs and human bodies.
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Location and orientation should
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2011-05-28 19:19:45 +03:00
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be easily reproducible, e.g., by marking the device's edges on the table
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with tape. Other transmitters in the 2.4 GHz band will interfere with
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measurements and should be kept as far away and as inactive as possible.
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<P>
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2011-05-18 20:25:54 +03:00
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<IMG src="setup-A.png">
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<P>
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-27 13:02:41 +03:00
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<SECTION ref="atusb" title="Test setup for atusb">
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2011-05-28 00:52:53 +03:00
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The test setup is the same as for <B>atben</B> testing, except that the
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DUT and reference device roles are reversed.
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<P>
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<IMG src="setup-B.png">
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<P>
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-27 13:02:41 +03:00
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<SECTION ref="procedure" title="Test procedure">
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2011-05-29 16:37:17 +03:00
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The test process is started from the directory <SAMP>ben-wpan/prod/</SAMP>
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with
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<PRE>
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make ben
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</PRE>
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for an <B>atben</B> DUT and with
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<PRE>
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make usb
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</PRE>
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for an <B>atusb</B> DUT. It performs the following steps:
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<UL>
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<LI>Enumeration (<B>atusb</B> only)
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<LI>LED (<B>atusb</B> only)
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<LI>GPIO scan
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<LI>Identification
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<LI>Crystal frequency
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<LI>Spectrum
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<LI>Receive
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<LI>Send
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</UL>
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Of these tests, only "LED" and "Spectrum" require operator input. The
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other tests run without interaction.
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<P>
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The test scripts log the commands they execute and their output in the
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file <SAMP>_log</SAMP>.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="Enumeration (atusb only)">
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The enumeration test verifies that the <B>atusb</B> board has been
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identified by the PC's USB stack. If this test fails, the board may
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not be plugged in correctly or it may be missing the firmware. A
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board that has passed both stages of the firmware flashing process
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should always pass the enumeration test.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="LED (atusb only)">
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2011-06-07 02:06:32 +03:00
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In the LED test, the <B>atusb</B> LED blinks quickly until the operator
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decides whether it is working properly.
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To finish the test, the operator must type either <B>P</B> to pass, or
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<B>F</B>, or <B>Q</B> to fail.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="GPIO scan">
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2011-06-04 17:19:46 +03:00
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The GPIO scan outputs a series of test patterns on the I/O lines driving
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the transceiver and compares the state at which the lines settle with a
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set of expected values. This allows the detection of unconnected pins
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and of shorted traces.
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<P>
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If the GPIO scan encounters an inconsistency, it fails the test and writes
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a report to the
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file <SAMP>_log</SAMP>. This report contains a list of GPIO pins with their
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configuration, the expected value, and their actual value.
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<P>
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For example, a short between SLP_TR and VDD on an <B>atben</B> board would
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be reported as follows:
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<PRE>
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name cfg exp got
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SCLK Z - 1
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MISO Z - 1
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SLP_TR Z 0 1 ***
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MOSI Z - 1
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nSEL Z 1 1
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IRQ Z 0 0
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at "zzozho", next "# reset state"
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</PRE>
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The configuration is <B>0</B> for a pin driven low, <B>1</B> for a pin driven
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high, <B>Z</B> for a pin in Hi-Z state, and <B>R</B> for Hi-Z state with a
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pull-up.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="Identification">
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This test reads the transceiver's registers that contain values identifying
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the manufacturer, the chip's part number, and the chip revision. If an
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<B>atusb</B> board fails this test, this probably means that the MISO signal
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between transceiver and the microcontroller has a problem.
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<P>
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On <B>atben</B>, failure may simply indicate an improperly
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inserted board. Eject the board, re-insert, and try again. If the test
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keeps on failing, this may indicate a problem with MOSI, MISO, nSEL,
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SCLK, the power supply, the crystal oscillator, or possibly the position
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of the transceiver chip.
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<P>
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Note: this test is meant as a higher level test. The GPIO test should
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eventually provide more detailed results for problems with the SPI interface.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-31 02:04:54 +03:00
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<SUBSECTION title="Crystal frequency">
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This test measures the frequency of the crystal oscillator in the DUT.
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On <B>atben</B>, it does this by transmitting packets, and measuring
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the time between the SLP_TR pulse that starts the transmission and the
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interrupt signaling the end of the transmission.
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On <B>atusb</B>, the microcontroller counts the clock cycles and the
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number of cycles is compared with the PC's NTP-disciplined clock.
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<P>
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If this test fails, this may indicate that the load capacitors of the
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crystal are missing, badly soldered, or have the wrong value. It could
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also mean that the crystal itself is defective. Another possible cause
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of oscillator malfunction could be flux residues bridging traces.
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<P>
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The <A href="fault.html">fault analysis page</A> has more details on
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testing the crystal oscillator.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="Spectrum">
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The spectrum test measures the reception of a signal sent from the
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reference device to the DUT. It does this across the entire frequency
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range in which the WPAN boards operate, allowing the detection of
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frequency-dependent anomalies.
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<P>
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This test depends on numerous external factors, like the exact position
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and orientation of the two devices with respect to each other, and the
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2011-05-29 16:37:17 +03:00
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presence of obstacles and conductive items (metal, people, etc.).
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Because of the test's sensitivity
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to environmental factors, the operator needs to decide when the result
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represents a valid measurement and then confirm the result shown.
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<P>
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The image below shows the typical display during the spectrum test:
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the white line is the measured signal strength. The red lines indicate
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the minimum and maximum allowed values. The green circle in the upper
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right corner indicates that the signal strength is within the limits.
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A downward-pointing red triangle would indicate that the signal is too
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weak, an upward-pointing yellow triangle would indicate that the signal
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is too strong.
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<P>
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<A href="atrf-path.png"><IMG src="atrf-path-small.png"</A>
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<P>
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To finish the test, the operator must type either <B>P</B>, <B>F</B>,
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or <B>Q</B> in the window shown. <B>P</B> means "pass" and can only be
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entered if the measurement is within the limits. <B>F</B> means "fail"
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and can only be entered if the measurements is outside the limits.
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<B>Q</B>, quit, can be entered at any time and also fails the test.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="Receive">
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In the receive test, the reference device sends a number of frames to the
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DUT. The test program verifies correct reception of all the frames. A
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device that has passed all the preceding tests should not encounter
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problems in the receive test. If it does, there may be a problem with
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the bypassing of the transceiver's 1.8 V supplies.
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<!-- ---------------------------------------------------------------------- -->
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2011-05-27 13:02:41 +03:00
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<SUBSECTION title="Send">
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The send test is like the receive test, but with the DUT acting as the
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sender and the reference acting as the receiver. If a device passes the
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receive test but fails the send test, there is probably an issue with
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the bypass capacitors of the analog 1.8 V supply.
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<P>
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Another possible cause could a problem with the SLP_TR signal. The
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GPIO test should eventually catch this issue, but it may currently
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remain undetected until the send test.
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2011-05-18 20:25:54 +03:00
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2011-05-27 19:14:32 +03:00
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<END author="Werner Almesberger" date="<GEN_DATE>">
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2011-05-18 20:25:54 +03:00
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</BODY>
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</HTML>
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