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prod/doc/test.hmac: expanded GPIO scan section (in progress)
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@ -111,7 +111,31 @@ should always pass the enumeration test.
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<SUBSECTION title="GPIO scan">
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@@@
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The GPIO scan outputs a series of test patterns on the I/O lines driving
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the transceiver and compares the state at which the lines settle with a
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set of expected values. This allows the detection of unconnected pins
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and of shorted traces.
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<P>
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If the GPIO scan encounters an inconsistency, it fails the test and writes
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a report to the
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file <SAMP>_log</SAMP>. This report contains a list of GPIO pins with their
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configuration, the expected value, and their actual value.
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<P>
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For example, a short between SLP_TR and VDD on an <B>atben</B> board would
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be reported as follows:
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<PRE>
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name cfg exp got
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SCLK Z - 1
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MISO Z - 1
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SLP_TR Z 0 1 ***
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MOSI Z - 1
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nSEL Z 1 1
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IRQ Z 0 0
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at "zzlzhl", next "# reset state"
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</PRE>
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The configuration is <B>0</B> for a pin driven low, <B>1</B> for a pin driven
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high, <B>Z</B> for a pin in Hi-Z state, and <B>R</B> for Hi-Z state with a
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pull-up.
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<!-- ---------------------------------------------------------------------- -->
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