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prod/: use positive and negative offset in spectrum test

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This way, we can also spot issues in the digital interface leading to
mis-configurations. E.g., this one would be a defective SLP_TR line
in atusb:
http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png

- prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets
- prod/Makefile (spectrum): print a direction indication before
  running atrf-path
This commit is contained in:
Werner Almesberger 2011-06-07 08:09:20 -03:00
parent 6e3edf3d2e
commit 66fb9d808c
2 changed files with 5 additions and 4 deletions
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3
prod/Common
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@ -178,8 +178,7 @@ spectrum()
# todo:
# - trim values (maybe)
# - decide on power
# - decide on offset
cmd "atrf-path -g -T +0.5 -P $PROFILE $REF $DUT 10"
cmd "atrf-path -g -P $PROFILE $REF $DUT 10"
expect PASS
}

6
prod/Makefile
View File

@ -34,10 +34,12 @@ flash:
./atusb-flash $(ATUSB_REF) $(ATUSB_DUT)
spectrum:
atrf-path -g -T +0.5 $(ATBEN_REF) $(ATBEN_DUT) 10 | \
@echo "$(ATBEN_REF) => $(ATBEN_DUT)"
atrf-path -g $(ATBEN_REF) $(ATBEN_DUT) 10 | \
$(GENPATHPROF) $(SPECTRUM_MARGIN) >ben.profile || \
{ rm -rf ben.profile; exit 1; }
atrf-path -g -T +0.5 $(ATUSB_REF) $(ATUSB_DUT) 10 | \
@echo "$(ATBEN_DUT) => $(ATBEN_BEN)"
atrf-path -g $(ATUSB_REF) $(ATUSB_DUT) 10 | \
$(GENPATHPROF) $(SPECTRUM_MARGIN) >usb.profile || \
{ rm -rf usb.profile; exit 1; }