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prod/doc/test.hmac: expanded GPIO scan section (in progress)

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This commit is contained in:
Werner Almesberger 2011-06-04 11:19:46 -03:00
parent 6bf03fe0a6
commit d1dd611d1e
1 changed files with 25 additions and 1 deletions
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prod/doc/test.hmac
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@ -111,7 +111,31 @@ should always pass the enumeration test.
<SUBSECTION title="GPIO scan">
@@@
The GPIO scan outputs a series of test patterns on the I/O lines driving
the transceiver and compares the state at which the lines settle with a
set of expected values. This allows the detection of unconnected pins
and of shorted traces.
<P>
If the GPIO scan encounters an inconsistency, it fails the test and writes
a report to the
file <SAMP>_log</SAMP>. This report contains a list of GPIO pins with their
configuration, the expected value, and their actual value.
<P>
For example, a short between SLP_TR and VDD on an <B>atben</B> board would
be reported as follows:
<PRE>
name cfg exp got
SCLK Z - 1
MISO Z - 1
SLP_TR Z 0 1 ***
MOSI Z - 1
nSEL Z 1 1
IRQ Z 0 0
at "zzlzhl", next "# reset state"
</PRE>
The configuration is <B>0</B> for a pin driven low, <B>1</B> for a pin driven
high, <B>Z</B> for a pin in Hi-Z state, and <B>R</B> for Hi-Z state with a
pull-up.
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