Werner Almesberger 66fb9d808c prod/: use positive and negative offset in spectrum test ...

This way, we can also spot issues in the digital interface leading to
mis-configurations. E.g., this one would be a defective SLP_TR line
in atusb:
http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png

- prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets
- prod/Makefile (spectrum): print a direction indication before
  running atrf-path

2011-06-07 08:09:20 -03:00

..

doc

prod/doc/: atrf-path now accepts keypresses from all the usual places

2011-06-06 20:26:18 -03:00

atben

prod/atben: quote command containing !, to make it easier to copy & paste

2011-06-06 00:15:55 -03:00

atusb

prod/atusb (led): added the LED test

2011-06-06 19:58:13 -03:00

atusb-flash

atusb-flash: show avrdude progress output

2011-05-31 03:30:57 -03:00

Common

prod/: use positive and negative offset in spectrum test

2011-06-07 08:09:20 -03:00

Makefile

prod/: use positive and negative offset in spectrum test

2011-06-07 08:09:20 -03:00