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mirror of git://projects.qi-hardware.com/ben-wpan.git synced 2024-11-29 03:11:52 +02:00
ben-wpan/prod
Werner Almesberger 66fb9d808c prod/: use positive and negative offset in spectrum test
This way, we can also spot issues in the digital interface leading to
mis-configurations. E.g., this one would be a defective SLP_TR line
in atusb:
http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png

- prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets
- prod/Makefile (spectrum): print a direction indication before
  running atrf-path
2011-06-07 08:09:20 -03:00
..
doc prod/doc/: atrf-path now accepts keypresses from all the usual places 2011-06-06 20:26:18 -03:00
atben prod/atben: quote command containing !, to make it easier to copy & paste 2011-06-06 00:15:55 -03:00
atusb prod/atusb (led): added the LED test 2011-06-06 19:58:13 -03:00
atusb-flash atusb-flash: show avrdude progress output 2011-05-31 03:30:57 -03:00
Common prod/: use positive and negative offset in spectrum test 2011-06-07 08:09:20 -03:00
Makefile prod/: use positive and negative offset in spectrum test 2011-06-07 08:09:20 -03:00