Werner Almesberger 66fb9d808c prod/: use positive and negative offset in spectrum test ... This way, we can also spot issues in the digital interface leading to mis-configurations. E.g., this one would be a defective SLP_TR line in atusb: http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png - prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets - prod/Makefile (spectrum): print a direction indication before running atrf-path		2011-06-07 08:09:20 -03:00
..
doc	prod/doc/: atrf-path now accepts keypresses from all the usual places	2011-06-06 20:26:18 -03:00
atben	prod/atben: quote command containing !, to make it easier to copy & paste	2011-06-06 00:15:55 -03:00
atusb	prod/atusb (led): added the LED test	2011-06-06 19:58:13 -03:00
atusb-flash	atusb-flash: show avrdude progress output	2011-05-31 03:30:57 -03:00
Common	prod/: use positive and negative offset in spectrum test	2011-06-07 08:09:20 -03:00
Makefile	prod/: use positive and negative offset in spectrum test	2011-06-07 08:09:20 -03:00