1
0
mirror of git://projects.qi-hardware.com/ben-wpan.git synced 2024-11-05 09:56:17 +02:00
ben-wpan/prod/Makefile
Werner Almesberger 66fb9d808c prod/: use positive and negative offset in spectrum test
This way, we can also spot issues in the digital interface leading to
mis-configurations. E.g., this one would be a defective SLP_TR line
in atusb:
http://downloads.qi-hardware.com/people/werner/wpan/tmp/jagged.png

- prod/Makefile, prod/Common: removed "-T +0.5" to use both offsets
- prod/Makefile (spectrum): print a direction indication before
  running atrf-path
2011-06-07 08:09:20 -03:00

54 lines
1.2 KiB
Makefile

#
# prod/Makefile - Run the production test process (reference/development)
#
# Written 2011 by Werner Almesberger
# Copyright 2011 Werner Almesberger
#
# This program is free software; you can redistribute it and/or modify
# it under the terms of the GNU General Public License as published by
# the Free Software Foundation; either version 2 of the License, or
# (at your option) any later version.
#
ATBEN_DUT=net:ben
ATBEN_REF=usb
ATUSB_DUT=usb
ATUSB_REF=net:ben
SPECTRUM_MARGIN=+5 +5
GENPATHPROF=../tools/atrf-path/genpathprof
.PHONY: all ben usb flash spectrum spotless
all: ben
ben: ben.profile
./atben $(ATBEN_REF) $(ATBEN_DUT)
usb: usb.profile
./atusb $(ATUSB_REF) $(ATUSB_DUT)
flash:
./atusb-flash $(ATUSB_REF) $(ATUSB_DUT)
spectrum:
@echo "$(ATBEN_REF) => $(ATBEN_DUT)"
atrf-path -g $(ATBEN_REF) $(ATBEN_DUT) 10 | \
$(GENPATHPROF) $(SPECTRUM_MARGIN) >ben.profile || \
{ rm -rf ben.profile; exit 1; }
@echo "$(ATBEN_DUT) => $(ATBEN_BEN)"
atrf-path -g $(ATUSB_REF) $(ATUSB_DUT) 10 | \
$(GENPATHPROF) $(SPECTRUM_MARGIN) >usb.profile || \
{ rm -rf usb.profile; exit 1; }
ben.profile:
cp ../tools/atrf-path/profile.example $@
usb.profile:
cp ../tools/atrf-path/profile.example $@
spotless:
rm -f ben.profile usb.profile