2011-05-18 20:25:54 +03:00
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<TITLE>Production and testing: Fault analysis</TITLE>
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<H1>Production and testing: Fault analysis</H1>
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<H2>Component placement and orientation</H2>
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<H2>Supply voltages</H2>
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2011-05-19 19:55:03 +03:00
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The transceiver has three voltage domains:
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<UL>
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<LI>The supply and I/O voltage, which is nominally 3.3 V in
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<B>atben</B> and <B>atusb</B>,
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<LI>the digital (core) supply, which is nominally 1.8 V, and
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<LI>the analog (RF) supply, which is nominally 1.8 V.
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</UL>
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<BR>
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On <B>atusb</B>, there is also the USB voltage domain at nominally 5.0 V.
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<P>
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Voltages should be tested in the following order: USB, then I/O, then
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digital, and finally analog. The table below gives the permissible
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ranges. Any voltages outside of these ranges indicate a problem.
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<P>
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2011-05-19 20:46:53 +03:00
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<TABLE frame="border" cellpadding="2">
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2011-05-19 19:55:03 +03:00
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<TR><TH>Domain<TH>Nominal<TH>Minimum<TH>Maximum
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<TR><TD>USB<TD>5.0 V<TD>4.5 V<TD>5.25 V
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<TR><TD>I/O<TD>3.3 V<TD>3.0 V<TD>3.6 V
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<TR><TD>Digital<TD>1.8 V<TD>1.7 V<TD>1.9 V
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<TR><TD>Analog<TD>1.8 V<TD>1.7 V<TD>1.9 V
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</TABLE>
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<P>
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<H3>Measurement setup</H3>
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The measurements should be performed either with a digital multimeter.
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To enable all voltage domains, put the transceiver in receive mode:
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<PRE>
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atrf-txrx
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</PRE>
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or
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<PRE>
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atrf-txrx -d net:ben
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</PRE>
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Exit with Ctrl-C.
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<P>
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To produce periodic transmissions in addition to enabling all voltage
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domains, use
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<PRE>
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atrf-txrx -p 3 -E 0
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</PRE>
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or
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<PRE>
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atrf-txrx -d net:ben -p 3 -E 0
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</PRE>
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Again, exit with Ctrl-C. Note that the transmissions may disturb nearby
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equipment operating in the 2.4 GHz band, such as 802.11 networks. This
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can be prevented by shorting the antenna to ground.
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<P>
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In case the board does not accept commands, only the USB and I/O voltage
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can be checked. If they are correct, proceed with checking the clock.
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<!-- ---------------------------------------------------------------------- -->
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<H3>Measurement points on atben</H3>
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<!-- ---------------------------------------------------------------------- -->
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<H3>Measurement points on atusb</H3>
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<!-- ====================================================================== -->
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2011-05-18 20:25:54 +03:00
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2011-05-18 20:43:45 +03:00
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<H2>Clock frequency</H2>
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2011-05-18 20:25:54 +03:00
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The flawless performance of the crystal oscillator is crucial for
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operation. Anomalies are easy to detect with even a low-cost oscilloscope
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and pinpoint specific problems and help to select further analysis steps.
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<P>
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The crystal used in <B>atben</B> and <B>atusb</B> has a nominal tolerance
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2011-05-19 20:46:53 +03:00
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of +/− 15 ppm at 22-28 C. Low-cost oscilloscopes typically have a timing
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2011-05-18 20:25:54 +03:00
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accuracy of
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2011-05-19 20:46:53 +03:00
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+/− 100 ppm, which means that only major excursions can be detected by
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2011-05-18 20:25:54 +03:00
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measuring the clock output with such an instrument. Full-speed USB only
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2011-05-19 20:46:53 +03:00
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requires an accuracy of +/− 2500 ppm.
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We can therefore consider all results within a range of +/− 1000 ppm as
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2011-05-18 20:25:54 +03:00
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sufficient, and perform more precise measurements by other means. This
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applies to <B>atben</B> as well as to <B>atusb</B>.
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<P>
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2011-05-18 20:43:45 +03:00
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<!-- ---------------------------------------------------------------------- -->
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<H3>Measuring the clock on atben</H3>
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2011-05-18 20:25:54 +03:00
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<B>atben</B> normally does not output a clock signal. A 1 MHz clock
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can be enabled with the following command:
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<PRE>
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atrf-txrx -d net:ben -C 1
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</PRE>
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This configures <B>atben</B> as a promiscuous receiver. The reception
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of any IEEE 802.15.4 frame or pressing Ctrl-C will terminate the command.
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<P>
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2011-05-19 20:46:53 +03:00
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<TABLE frame="border" cellpadding="2">
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2011-05-18 20:25:54 +03:00
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<TR><TH align="left">Clock<TH align="left">Action
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<TR><TD>0 Hz<TD>Check voltages; check that the clock is enabled;
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check for shorts around crystal; check connectivity of crystal
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<TR><TD>0.999-1.001 MHz, ~3.3 Vpp<TD>Perform precision measurement with
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<B>atrf-xtal</B>
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<TR><TD>Other<TD>Check voltages; check for contamination around crystal
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</TABLE>
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<P>
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2011-05-18 20:43:45 +03:00
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<!-- ---------------------------------------------------------------------- -->
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<H3>Measuring the clock on atusb</H3>
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2011-05-18 20:25:54 +03:00
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The transceiver provides the clock for the microcontroller in <B>atusb</B>.
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A clock signal is therefore always available. Immediately after reset,
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the transceiver generates a 1 MHz clock. When the microcontrolled comes out
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of reset, it raises the transceiver's clock output to 8 MHz and then
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enables USB.
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<P>
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2011-05-19 20:46:53 +03:00
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<TABLE frame="border" cellpadding="2">
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2011-05-18 20:25:54 +03:00
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<TR><TH align="left">Clock<TH align="left">Action
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<TR><TD>0 Hz<TD>Check voltages; check for shorts around crystal; check
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connectivity of crystal
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<TR><TD>0.999-1.001 MHz, ~3.3 Vpp<TD>Check presence of firmware; check for
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shorts on SPI signals; check connectivity of SPI signals
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<TR><TD>7.992-8.008 MHz, ~3.3 Vpp<TD>Perform precision measurement with
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<B>atrf-xtal</B>
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<TR><TD>Other<TD>Check voltages; check for contamination around crystal
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</TABLE>
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2011-05-18 20:43:45 +03:00
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<!-- ---------------------------------------------------------------------- -->
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<H3>Precision measurements</H3>
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2011-05-18 20:25:54 +03:00
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2011-05-18 23:49:58 +03:00
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The clock frequency of <B>atben</B> can be measured with an accuracy
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2011-05-19 20:46:53 +03:00
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of about +/− 100 ppm using the program <B>atrf-xtal</B>. <B>atrf-xtal</B>
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runs directly on the Ben and measures the duration of packet transmissions.
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The transmission time depends on the bit clock which is in turn derived
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from the oscillator.
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<PRE>
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atrf-xtal 100
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</PRE>
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The number reported is the number of poll loops the CPU counted. This
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value should be compared to a reference count obtained with a known to
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be good <B>atben</B> board and the same Ben at a comparable temperature.
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<P>
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2011-05-19 20:46:53 +03:00
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<TABLE frame="border" cellpadding="2">
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2011-05-18 23:49:58 +03:00
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<TR><TH align="left">Difference<TH align="left">Action
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<TR><TD>> +/− 50 ppm<TD>Correct operation
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<TR><TD>< −80 ppm<TD>Check soldering of capacitors;
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check for contamination around crystal
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<TR><TD>> +120 ppm<TD>idem
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<TR><TD>Other<TD>Divergence can be compensated by adjusting trim value
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</TABLE>
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2011-05-18 20:25:54 +03:00
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<P>
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<HR>
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2011-05-18 20:55:22 +03:00
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Up: <A href="index.html">Production and testing</A>
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Prev: <A href="test.html">Functional test</A>
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<HR>
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2011-05-18 20:25:54 +03:00
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Last update: 2011-05-18 <I>Werner Almesberger</I>
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<HR>
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</BODY>
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</HTML>
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